Stefan Rakel, M.Sc. RWTH

Wissenschaftlicher Mitarbeiter

Kontakt

rakel[at]embedded[dot]rwth-aachen[dot]de

Tel. +49 241 80 21165
Fax +49 241 80 22150

Adresse: Ahornstr. 55, 52074 Aachen, Germany
Büro: Raum 2322 (Gebäude H)

Sprechstunde

Nach Vereinbarung

Lehre

Semester Titel Art
Sommersemester 17 Entwicklung NXT gesteuerter LEGO-Fahrzeuge mit Java P
Wintersemester 17/18 Praktikum Systemprogrammierung P
Modellbasiertes Testen & Analyse eingebetteter Software S
Sommersemester 18 Praktikum Systemprogrammierung P
Modellbasiertes Testen & Analyse eingebetteter Software S
Wintersemester 18/19 Praktikum Systemprogrammierung P
Seminar & Proseminar S
Sommersemester 19 Praktikum Systemprogrammierung P
Seminar & Proseminar S
Wintersemester 19/20 Praktikum Systemprogrammierung P
Seminar & Proseminar S
Sommersemester 20 Praktikum Systemprogrammierung P
Seminar & Proseminar S
Wintersemester 20/21 psp P
Seminar & Proseminar S
Sommersemester 22 Seminar S

Offene Abschlussarbeiten

Laufende Abschlussarbeiten

Betreute Abschlussarbeiten

Publikationen


Publikations-Export
[SRT+20]
PDFBIB
Smieschek, M., Rakel, S., Thönnessen, D., Derks, A., Stollenwerk, A., and Kowalewski, S., "A Remote Test Environment for a Large-Scale Microcontroller Laboratory Course", in Proc. Cyber physical systems : model-based design : 9th international workshop, CyPhy 2019 and 15th international workshop, WESE 2019, New York City, NY, USA, October 17-18, 2019 : revised selected papers / Roger Chamberlain, Martin Edin Grimheden, Walid Taha (eds.), Cham, 2020 in Lecture Notes in Computer Science, Springer, pp. 231-246.

A Remote Test Environment for a Large-Scale Microcontroller Laboratory Course

Bibtex entry :

@inproceedings {  SRT+20,
	author = { Smieschek, Manfred and Rakel, Stefan and Th{\"o}nnessen,
		David and Derks, Andreas and Stollenwerk, André and
		Kowalewski, Stefan },
	title = { A Remote Test Environment for a Large-Scale Microcontroller
		Laboratory Course },
	booktitle = { Cyber physical systems : model-based design : 9th
		international workshop, CyPhy 2019 and 15th international
		workshop, WESE 2019, New York City, NY, USA, October 17-18,
		2019 : revised selected papers / Roger Chamberlain, Martin
		Edin Grimheden, Walid Taha (eds.) },
	publisher = { Springer },
	pages = { 231-246 },
	series = { Lecture Notes in Computer Science },
	year = { 2020 },
	address = { Cham },
	organization = { Workshop on Embedded Systems and Cyber-Physical Systems
		Education, New York (USA), 2019-10-17 - 2019-10-18 },
	doi = { 10.1007/978-3-030-41131-2_11 },
	typ = { PUB:(DE-HGF)7 },
	reportid = { RWTH-2020-02344 },
	cin = { 122810 / 120000 },
	url = { http://publications.rwth-aachen.de/record/783169/files/Remote%20Pool%20Final.pdf },
}
[TRR+18]
PDFBIB
Thönnessen, D., Rakel, S., Reinker, N., and Kowalewski, S., "Matching Discrete Signals for Hardware-in-the-Loop-Testing of PLCs", IFAC-PapersOnLine, vol. 51, iss. 10, pp. 229-234, 2018

Matching Discrete Signals for Hardware-in-the-Loop-Testing of PLCs

Bibtex entry :

@article {  TRR+18,
	author = { Th{\"o}nnessen, David and Rakel, Stefan and Reinker, Niklas
		and Kowalewski, Stefan },
	title = { Matching Discrete Signals for Hardware-in-the-Loop-Testing
		of PLCs },
	journal = { IFAC-PapersOnLine },
	pages = { 229-234 },
	volume = { 51 },
	number = { 10 },
	year = { 2018 },
	address = { Laxenburg },
	issn = { 2405-8963 },
	organization = { 3. IFAC Conference on Embedded Systems, Computational
		Intelligence and Telematics in Control },
	doi = { 10.1016/j.ifacol.2018.06.267 },
	typ = { PUB:(DE-HGF)16 },
	reportid = { RWTH-2018-227582 },
	cin = { 122810 / 110000 / 120000 },
	url = { http://publications.rwth-aachen.de/record/731576 },
}
[TRR+18a]
PDFBIB
Thönnessen, D., Reinker, N., Rakel, S., Svetlakov, A., and Kowalewski, S., "Correctness Properties and Exemplified Applicability of a Signal Matching Algorithm with Multidimensional Tolerance Specifications", in Proc. 2018 IEEE 14th International Conference on Automation Science and Engineering (CASE) : 20-24 Aug. 2018 / general chair: Birgit Vogel-Heuser (Technical University of Munich) ; publisher: IEEE, Piscataway, NJ, 2018, IEEE, pp. 1197-1202.

Correctness Properties and Exemplified Applicability of a Signal Matching Algorithm with Multidimensional Tolerance Specifications

Bibtex entry :

@inproceedings {  TRR+18a,
	author = { Th{\"o}nnessen, David and Reinker, Niklas and Rakel, Stefan
		and Svetlakov, Andrei and Kowalewski, Stefan },
	title = { Correctness Properties and Exemplified Applicability of a
		Signal Matching Algorithm with Multidimensional Tolerance
		Specifications },
	booktitle = { 2018 IEEE 14th International Conference on Automation
		Science and Engineering (CASE) : 20-24 Aug. 2018 / general
		chair: Birgit Vogel-Heuser (Technical University of Munich)
		; publisher: IEEE },
	publisher = { IEEE },
	pages = { 1197-1202 },
	year = { 2018 },
	address = { Piscataway, NJ },
	organization = { IEEE 14. International Conference on Automation Science and
		Engineering, Munich (Germany), 2018-08-20 - 2018-08-24 },
	doi = { 10.1109/COASE.2018.8560407 },
	typ = { PUB:(DE-HGF)7 },
	reportid = { RWTH-2019-00319 },
	cin = { 122810 / 120000 },
	url = { http://publications.rwth-aachen.de/record/752982/files/752982.pdf },
}
[TRR+17]
PDFBIB
Thönnessen, D., Reinker, N., Rakel, S., and Kowalewski, S., "A concept for PLC hardware-in-the-loop testing using an extension of structured text", in Proc. 2017 22nd IEEE International Conference on Emerging Technologies and Factory Automation : September 12-15, 2017, Limassol, Cyprus / ABB, IEEE, IES, University of Cyprus, Piscataway, NJ, 2017, IEEE, p. 8.

A concept for PLC hardware-in-the-loop testing using an extension of structured text

Bibtex entry :

@inproceedings {  TRR+17,
	author = { Th{\"o}nnessen, David and Reinker, Niklas and Rakel, Stefan
		and Kowalewski, Stefan },
	title = { A concept for PLC hardware-in-the-loop testing using an
		extension of structured text },
	booktitle = { 2017 22nd IEEE International Conference on Emerging
		Technologies and Factory Automation : September 12-15, 2017,
		Limassol, Cyprus / ABB, IEEE, IES, University of Cyprus },
	publisher = { IEEE },
	pages = { 8 Seiten },
	year = { 2017 },
	address = { Piscataway, NJ },
	organization = { 22. IEEE International Conference on Emerging Technologies
		and Factory Automation, Limassol (Cyprus), 2017-09-12 -
		2017-09-15 },
	doi = { 10.1109/ETFA.2017.8247580 },
	typ = { PUB:(DE-HGF)7 },
	reportid = { RWTH-2018-223452 },
	cin = { 122810 / 120000 },
	url = { http://publications.rwth-aachen.de/record/722218 },
}